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Combining Non-Rigid Registration with Non-Local Principle Component Analysis for Atomic Resolution EDS Mapping

Published online by Cambridge University Press:  25 July 2016

Chenyu Zhang ,
Albert Oh ,
Andrew Yankovich ,
Thomas Slater ,
Sarah Haigh ,
Rebecca Willett  and
Paul M. Voyles
Chenyu Zhang
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Albert Oh
Affiliation:
Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Andrew Yankovich
Affiliation:
Department of Physics, Chalmers University of Technology, Gothenburg, Sweden
Thomas Slater
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Sarah Haigh
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK
Rebecca Willett
Affiliation:
Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Paul M. Voyles
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1406 - 1407
Copyright
© Microscopy Society of America 2016 

References

[1] Chu, M.-W., et al., Phys. Rev. Lett 104, 196101 (2010).Google Scholar
[2] D’Alfonso, A. J. Phys. Rev. B 81, 100101 (2010).Google Scholar
[3] Salmon, J., et al, Journal of mathematical imaging and vision 48 (2014). p. 279–294.CrossRefGoogle Scholar
[4] Yankovich, A.B., et al, Nat. Commun 5 (2014). p. 4155.CrossRefGoogle Scholar
[5] This work was supported by the US Department of Energy, Basic Energy Sciences, under grant DE-FG02-08ER46547.Google Scholar