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Compressed Sensing, Sparsity, and the Reliability of Tomographic Reconstructions

Published online by Cambridge University Press:  27 August 2014

Yi Jiang ,
Robert Hovden ,
David A. Muller  and
Veit Elser
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853
Robert Hovden
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853
Veit Elser
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 796 - 797
Copyright
Copyright © Microscopy Society of America 2014 

References

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