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Conductive Atomic Force Microscopy Study of Doped Tin Oxide Thin Film

Published online by Cambridge University Press:  01 August 2010

L Fang  and
R Korotkov
L Fang
Affiliation:
Arkema Inc
R Korotkov
Affiliation:
Arkema Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1562 - 1563
Copyright
Copyright © Microscopy Society of America 2010