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Contamination and Charging of Amorphous Thin Films Suitable as Phase Plates for Phase-Contrast Transmission Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

Simon Hettler ,
Peter Hermann ,
Manuel Dries ,
Martin Obermair ,
Dagmar Gerthsen  and
Marek Malac
Simon Hettler
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany.
Peter Hermann
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany.
Manuel Dries
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany.
Martin Obermair
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany.
Dagmar Gerthsen
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany.
Marek Malac
Affiliation:
National Institute for Nanotechnology (NRC) and Department of Physics, University of Alberta, Edmonton, Canada.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 830 - 831
Copyright
© Microscopy Society of America 2017 

References

[1] Hren, J J Ultramicroscopy 3 1979 91–95.Google Scholar
[2] Malac, M, et al, Ultramicroscopy 118 2012 77–89.Google Scholar
[3] Danev, R, et al, PNAS 111 2014 15635–15640.Google Scholar
[4] Hettler, S, et al Micron (2017), accepted.Google Scholar
[5] The authors acknowledge funding from the German Research Foundation, KHYS and NRC.Google Scholar