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Correlating Nanoscale Defects with Electronic Properties in MgO Magnetic Tunnel Junctions by Aberration-Corrected STEM-EELS

Published online by Cambridge University Press:  01 August 2010

PY Huang ,
JJ Cha ,
JC Read ,
H-W Tseng ,
Y Li ,
PG Gowtham ,
RA Buhrman  and
DA Muller
PY Huang
Affiliation:
Cornell University
JJ Cha
Affiliation:
Cornell University
JC Read
Affiliation:
Cornell University
H-W Tseng
Affiliation:
Cornell University
Y Li
Affiliation:
Cornell University
PG Gowtham
Affiliation:
Cornell University
RA Buhrman
Affiliation:
Cornell University
DA Muller
Affiliation:
Cornell University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1908 - 1909
Copyright
Copyright © Microscopy Society of America 2010