Article contents
Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[6]The authors acknowledge financial support from the Deutsche Forschungsgemeinschaft (DFG) under research grant MO 3010/3-1 and the European Research Council (ERC) ”Horizon 2020” Program under Grant No. 805359-FOXON.Google Scholar
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