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Correlative In-Situ AFM & SEM & EDX Analysis of Nanostructured Materials

Published online by Cambridge University Press:  04 August 2017

M. Winhold ,
M. Leitner ,
A. Lieb ,
P. Frederix ,
F. Hofbauer ,
T. Strunz ,
J. Sattelkov ,
H. Plank  and
C.H. Schwalb
M. Winhold
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
M. Leitner
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
A. Lieb
Affiliation:
Nanosurf AG, Liestal, Switzerland.
P. Frederix
Affiliation:
Nanosurf AG, Liestal, Switzerland.
F. Hofbauer
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
T. Strunz
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
C.H. Schwalb
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 26 - 27
Copyright
© Microscopy Society of America 2017 

References

[1] Dukic, M, Adams, JD & Fantner, GE Scientific Reports 5 (2015) 16393.CrossRefGoogle Scholar
[2] Matsumae, T, Koehler, AD, Suga, T & Hobart, KD Journal of the Electromechanical Society 163(6), E159–E161, 2016.CrossRefGoogle Scholar