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Correlative Microscopy: Progress in Simultaneous Atomic-column XEDS and EELS, using a Monochromated, Aberration-corrected STEM

Published online by Cambridge University Press:  26 July 2009

DC Bell ,
R Schillinger ,
S Meyer  and
P Tayebati
DC Bell
Affiliation:
Harvard University
R Schillinger
Affiliation:
Carl Zeiss SMT,Inc
S Meyer
Affiliation:
Carl Zeiss SMT,Inc
P Tayebati
Affiliation:
Carl Zeiss SMT,Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 472 - 473
Copyright
Copyright © Microscopy Society of America 2009