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Correlative Tomography - Extraction of Reliable Information with Adequate Resolution from mm Scale Down to Sub-nm Scale
Published online by Cambridge University Press: 27 August 2014
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 838 - 839
- Copyright
- Copyright © Microscopy Society of America 2014
References
[1]
Ohser, J and Mücklich, F Statistical Analysis of Microstructures in Materials Science, John Wiley & Sons, Chichester (2000).Google Scholar
[3]
Webel, J Development of a Light Microscopy Serial Sectioning Tomography (in German), Bachelor Thesis, Saarland University (2014).Google Scholar
[4]
Lindow, N., Baum, D., Hege, H.-C. Eurographics Conference on Visualization 31 (2012) 1325-1334 [5] The authors acknowledge the funding from the German science foundation, MU 959/29.Google Scholar