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Cryo-Electrical Microscopy for Quantum and Advanced Energy Applications

Published online by Cambridge University Press:  30 July 2021

Khim Karki ,
Daan Hein Alsem  and
Norman Salmon
Khim Karki
Affiliation:
Hummingbird Scientific, Lacey, Washington, United States
Daan Hein Alsem
Affiliation:
Hummingbird Scientific, Lacey, Washington, United States
Norman Salmon
Affiliation:
Hummingbird Scientific, Lacey, Washington, United States

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2400 - 2401
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Moler, K. A., Nat. Mater. 2017, 16, 1049.CrossRefGoogle Scholar
Li, Y., et al. , Science (80-.). 2017, 358, 506 LP.CrossRefGoogle Scholar
Wang, X., et al. , Nano Lett. 2017, 17, 7606.CrossRefGoogle Scholar
Zachman, M. J., et al. , Nature 2018, 560, 345.CrossRefGoogle Scholar
Spoth, K.A., et al. , Microsc. Microanal (Suppl 2) 2019, 1660-1661CrossRefGoogle Scholar
Research material and image courtesy of UCSD/Battery500 ConsortiumGoogle Scholar
KK, DHA, and NS acknowledge funding from the Department of Energy, Office of Basic Energy Sciences, SBIR Grant # DE-SC0019627.Google Scholar