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Cryo-FIB and Transmission Electron Microscopy of Cryoformed Metals

Published online by Cambridge University Press:  22 July 2022

Ana Luisa Terasawa Senra ,
Daniel E. Huber ,
Ricardo S. Namur ,
Antonio J. Ramirez  and
Osvaldo M. Cintho
Ana Luisa Terasawa Senra*
Affiliation:
Materials Engineering Department, State University of Ponta Grossa, Ponta Grossa, PR, Brazil Welding Engineering, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, United States
Daniel E. Huber
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, United States
Ricardo S. Namur
Affiliation:
Materials Engineering Department, State University of Ponta Grossa, Ponta Grossa, PR, Brazil
Antonio J. Ramirez
Affiliation:
Welding Engineering, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, United States
Osvaldo M. Cintho
Affiliation:
Materials Engineering Department, State University of Ponta Grossa, Ponta Grossa, PR, Brazil
*
*Corresponding author: ana_terasawa@hotmail.com

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 40 - 42
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Copyright
Copyright © Microscopy Society of America 2022

References

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Namur, RS et al. , Microscopy and Microanalysis 25(S2) (2019), p. 916. doi:10.1017/S1431927619005312CrossRefGoogle Scholar