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Crystal Structure and Defect Analysis of Colloidal Supraparticles by Lab-Based X-ray Microscopy

Published online by Cambridge University Press:  22 July 2022

Silvan Englisch ,
Junwei Wang ,
Lukas J. Roemling ,
Johannes Voß ,
Janis Wirth ,
Chrameh Fru Mbah ,
Benjamin Apeleo Zubiri ,
Michael Engel ,
Nicolas Vogel  and
Erdmann Spiecker
Silvan Englisch*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
Junwei Wang
Affiliation:
Institute of Particle Technology, Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
Lukas J. Roemling
Affiliation:
Institute of Particle Technology, Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
Johannes Voß
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
Janis Wirth
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
Chrameh Fru Mbah
Affiliation:
Institute for Multiscale Simulation, IZNF, Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
Benjamin Apeleo Zubiri
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
Michael Engel
Affiliation:
Institute for Multiscale Simulation, IZNF, Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
Nicolas Vogel
Affiliation:
Institute of Particle Technology, Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
Erdmann Spiecker*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
*
*Corresponding authors: silvan.englisch@fau.de, erdmann.spiecker@fau.de
*Corresponding authors: silvan.englisch@fau.de, erdmann.spiecker@fau.de

Abstract

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Type
Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 306 - 309
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Copyright
Copyright © Microscopy Society of America 2022

References

Wang et, J.. al., ACS Nano 2019, 13, 8, 9005–9015 July 5CrossRefGoogle Scholar
Englisch, S., et. al. Microscopy and Microanalysis, 25(S2), 392-393 2019, 2019CrossRefGoogle Scholar
Pelz, P. M., et al. , ACS Nano 2022, 16, 1, 588–596CrossRefGoogle Scholar
Marks, L. and Peng, L, J. Phys.: Condens. Matter 2016, 28, 053001.Google Scholar
Niekiel, F. et al. , Journal of the Mechanics and Physics of Solids 2015, 84, 358-379.CrossRefGoogle Scholar
We gratefully acknowledge financial support by the German Research Foundation (DFG) within the frameworks of the research training group GRK1896 “In situ Microscopy with Electrons, X-rays and Scanning Probes” (Project-ID: 218975129), the project SP648/8 “High-resolution X-ray microscopy for correlative tomography, high throughput screening and in situ mechanical testing of structural and functional materials” (Project-ID 316992193), the Collaborative Research Centre 1411 “Design of Particulate Products” (Project-ID 416229255) and the Collaborative Research Centre 1452 “Catalysis at Liquid Interfaces” (Project-ID 431791331).Google Scholar