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Cs Corrected Bright Field Imaging of Radiation Sensitive Materials

Published online by Cambridge University Press:  01 August 2005

M Malac ,
M Beleggia ,
R F Egerton  and
Y Zhu
M Malac
Affiliation:
National Institute for Nanotechnology,Canada
M Beleggia
Affiliation:
Brookhaven National Laboratory
R F Egerton
Affiliation:
University of Alberta
Y Zhu
Affiliation:
Brookhaven National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 2150 - 2151
Copyright
© 2005 Microscopy Society of America