No CrossRef data available.
Article contents
Deep Data Mining in a Real Space: Application to Scanning Probe Microscopy Studies on a “Parent” State of a High Temperature Superconductor
Published online by Cambridge University Press: 25 July 2016
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927616007935/resource/name/firstPage-S1431927616007935a.jpg)
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1418 - 1419
- Copyright
- © Microscopy Society of America 2016
References
References:
[3] This research was sponsored by the Division of Materials Sciences and Engineering, BES, DOE. Research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility.Google Scholar