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Depth Profile Chemical State Analysis of Oxide Films on High Temperature Treated Stainless Steel Using EPMA with a Soft X-ray Spectrometer at Variable Accelerating Voltage

Published online by Cambridge University Press:  22 July 2022

Shiori Kamijyo ,
Hideyuki Takahashi ,
Konomi Ikita ,
Vernon Robertson  and
Peter McSwiggen
Shiori Kamijyo
Affiliation:
JEOL. Ltd., Akishima, Tokyo, Japan
Hideyuki Takahashi
Affiliation:
JEOL. Ltd., Akishima, Tokyo, Japan
Konomi Ikita
Affiliation:
JEOL. Ltd., Akishima, Tokyo, Japan
Vernon Robertson
Affiliation:
JEOL. Ltd., Peabody, Massachusetts, United States
Peter McSwiggen
Affiliation:
JEOL. Ltd., Akishima, Tokyo, Japan

Abstract

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Type
General Analytical Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1058 - 1060
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Copyright
Copyright © Microscopy Society of America 2022

References

Kajimura, Haruhiko, Journal of Society of Materials Science, Japan, Vol.60, No. 9Google Scholar