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Depth Resolved Measurements of Atomic Scale Defects in Ion Irradiated Fe Alloys
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Microscopy and Microanalysis of Nuclear and Irradiated Materials
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Krause-Rehberg, R, Leipner, HS. Positron annihilation in semiconductors: defect studies. Springer Science & Business Media; 1999.Google Scholar
The work was funded as part of FUTURE, an energy frontier research center funded by DOE, Office of Basic Energy Sciences.Google Scholar
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