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Designing Analytical Instrument Control Systems for Longevity and Maximum Upward Compatibility

Published online by Cambridge University Press:  23 September 2015

Edward Principe ,
Anthony D. Owens  and
William Mershon
Edward Principe
Affiliation:
Tescan USA, Product Manager FE-SEM and FIB-SEM Products, Warrendale, Pa. USA
Anthony D. Owens
Affiliation:
Tescan USA, Director of Technology, Warrendale, Pa. USA
William Mershon
Affiliation:
Tescan USA, Applications Manager, Warrendale, Pa. USA

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 367 - 368
Copyright
Copyright © Microscopy Society of America 2015