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Determination of Aberration Center of STEM Ronchigram for Fully Automated Aberration Correctors

Published online by Cambridge University Press:  09 October 2013

T. Sannomiya ,
H. Sawada ,
T. Nakamichi ,
F. Hosokawa ,
Y. Nakamura ,
Y. Tanishiro  and
K. Takayanagi
T. Sannomiya
Affiliation:
H. Sawada
Affiliation:
T. Nakamichi
Affiliation:
F. Hosokawa
Affiliation:
Y. Nakamura
Affiliation:
Y. Tanishiro
Affiliation:
K. Takayanagi
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 308 - 309
Copyright
Copyright © Microscopy Society of America 2013