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Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces via Aberration-Corrected Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2010

J Zhu ,
R Yu ,
ZY Cheng ,
T Ling ,
N Lu ,
L Xie ,
ZD Cheng ,
HH Zhou  and
XY Zhong
J Zhu
Affiliation:
Tsinghua University, China
R Yu
Affiliation:
Tsinghua University, China
ZY Cheng
Affiliation:
Tsinghua University, China
T Ling
Affiliation:
Tianjin University, China
N Lu
Affiliation:
Tsinghua University, China
L Xie
Affiliation:
Tsinghua University, China
ZD Cheng
Affiliation:
Tsinghua University, China
HH Zhou
Affiliation:
Tsinghua University, China
XY Zhong
Affiliation:
Tsinghua University, China

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1436 - 1437
Copyright
Copyright © Microscopy Society of America 2010