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The Determination of Rotation Axis in the Rotation Electron Diffraction Technique

Published online by Cambridge University Press:  07 August 2013

Mika Buxhuku ,
Vidar Hansen ,
Peter Oleynikov  and
Jon Gjønnes
Mika Buxhuku*
Affiliation:
Department of Mechanical and Structure Engineering and Material Science, University of Stavanger, N-4036 Stavanger, Norway
Vidar Hansen
Affiliation:
Department of Mechanical and Structure Engineering and Material Science, University of Stavanger, N-4036 Stavanger, Norway
Peter Oleynikov
Affiliation:
Department of Inorganic and Structural Chemistry, Department of Materials and Environmental Chemistry, Stockholm University, 106 91 Stockholm, Sweden
Jon Gjønnes
Affiliation:
Department of Physics, University of Oslo, Gaustadalleen 21, N-0371 Oslo, Norway
*
*Corresponding author. E-mail: mikabuxhuku@yahoo.com
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Abstract

Methods to determine the rotation axis using the rotation electron diffraction technique are described. A combination of rotation axis tilt, beam tilt, and simulated experimental diffraction patterns with nonintegers zone axis has been used. Accurate knowledge of the crystallographic direction of the incident beam for deducing the excitation error of reflections simultaneously near Bragg positions is essential in quantitative electron diffraction. Experimental patterns from CoP3 are used as examples.

Keywords

electron diffractionrotation axisnonintegers zone axisrotation electron diffraction technique
Type
Techniques and Software Development
Information
Microscopy and Microanalysis , Volume 19 , Issue 5 , October 2013 , pp. 1276 - 1280
Copyright
Copyright © Microscopy Society of America 2013 

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References

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