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Determination of Soft X-ray Emission Spectroscopy Parameters using Experimental Data for Quantitative Microanalysis

Published online by Cambridge University Press:  25 July 2016

Hendrix Demers ,
Colin M. MacRae ,
Nicholas C. Wilson ,
Pierre Hovington ,
Vladimir Timoshevskii ,
Raynald Gauvin  and
Karim Zaghib
Hendrix Demers
Affiliation:
.Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Colin M. MacRae
Affiliation:
.CSIRO Mineral Resources, Clayton, VIC, Australia.
Nicholas C. Wilson
Affiliation:
.CSIRO Mineral Resources, Clayton, VIC, Australia.
Pierre Hovington
Affiliation:
.Hydro-Quebec Research Institute, Varennes, Quebec, Canada.
Vladimir Timoshevskii
Affiliation:
.Hydro-Quebec Research Institute, Varennes, Quebec, Canada.
Raynald Gauvin
Affiliation:
.Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Karim Zaghib
Affiliation:
.Hydro-Quebec Research Institute, Varennes, Quebec, Canada.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 408 - 409
Copyright
© Microscopy Society of America 2016 

References

References:

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[3] Hovington, P., et al, Scanning (2016) doi: 10.1002/sca.21302.Google Scholar
[4] Gauvin, R. & Michaud, P. Microscopy and Microanalysis 15 (2009). p 488.Google Scholar
[5] Chantler, C., et al. (2005). [Online] Available: http://physics.nist.gov/ffast.Google Scholar