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Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset

Published online by Cambridge University Press:  04 August 2017

Ryusuke Sagawa ,
Hao Yang ,
Lewys Jones ,
Martin Simson ,
Martin Huth ,
Heike Soltau ,
Peter D. Nellist  and
Yukihito Kondo
Ryusuke Sagawa
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan.
Hao Yang
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, California, USA.
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
Martin Simson
Affiliation:
PNDetector, PNDetector GmbH, Munchen, Germany
Martin Huth
Affiliation:
PNDetector, PNDetector GmbH, Munchen, Germany
Heike Soltau
Affiliation:
PNDetector, PNDetector GmbH, Munchen, Germany
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
Yukihito Kondo
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 52 - 53
Copyright
© Microscopy Society of America 2017 

References

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