Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-13T07:03:13.378Z Has data issue: false hasContentIssue false
  • English
  • Français

Development of Quantitative Standards for Atom Probe Reconstruction Parameters for Analysis of Interfacial Chemistry

Published online by Cambridge University Press:  23 September 2015

S.R. Broderick ,
S. Dumpala ,
S.E. Young ,
K. Kaluskar ,
S. Srinivasan  and
K. Rajan
S.R. Broderick
Affiliation:
Department of Materials Science and Engineering and Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Iowa State University, Ames, USA
S. Dumpala
Affiliation:
Department of Materials Science and Engineering and Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Iowa State University, Ames, USA
S.E. Young
Affiliation:
Department of Materials Science and Engineering and Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Iowa State University, Ames, USA
K. Kaluskar
Affiliation:
Department of Materials Science and Engineering and Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Iowa State University, Ames, USA
S. Srinivasan
Affiliation:
Department of Materials Science and Engineering and Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Iowa State University, Ames, USA
K. Rajan
Affiliation:
Department of Materials Science and Engineering and Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Iowa State University, Ames, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 45 - 46
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] The authors acknowledge the support from Air Force Office of Scientific Research grants: FA9550-10-1-0256, FA9550-11-1-0158 and FA9550-12-1-0456; and NSF grants: ARI Program CMMI-09-389018 and PHY CDI-09-41576.Google Scholar