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Direct Electromagnetic Structure Observation by Aberration-corrected Differential Phase Contrast Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  25 July 2016

N. Shibata ,
S.D. Findlay ,
T. Matsumoto ,
T. Seki ,
G. Sánchez-Santolino ,
Y. Kohno ,
H. Sawada ,
H. Sasaki ,
Y.G. So  and
R. Ishikawa
...Show all authors
N. Shibata
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan
S.D. Findlay
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
T. Matsumoto
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan
T. Seki
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan
G. Sánchez-Santolino
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan
Y. Kohno
Affiliation:
JEOL Ltd., Tokyo, Japan
H. Sawada
Affiliation:
JEOL Ltd., Tokyo, Japan
H. Sasaki
Affiliation:
Yokohama R&D Lab., Furukawa Electric Ltd., Yokohama, Japan
Y.G. So
Affiliation:
Department of Materials Science and Engineering, Graduate School of Engineering and Resource Science, Akita University, Akita, Japan
R. Ishikawa
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan
Y. Ikuhara
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya, Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 906 - 907
Copyright
© Microscopy Society of America 2016 

References

[1] Shibata, N., et al., J. Electron Microscopy 59, 473–479, 2010.Google Scholar
[2] Dekkers, N.H. & de Lang, H. Optik 41, 452 (1974).Google Scholar
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[5] Shibata, N., et al., Sci. Rep. 5, 10040 (2015).Google Scholar
[6] Matsumoto, T., et al., Sci. Adv 2, e1501280 (2016).CrossRefGoogle Scholar
[7] Close, R., et al., Ultramicroscopy 159, 124–137, 2015.CrossRefGoogle Scholar
[8] Shibata, N., et al., Nature Phys. 8, 611–615, 2012.Google Scholar
[9] This work was supported by the PRESTO and SENTAN, JST and the JSPS KAKENHI Grant number 26289234. A part of this work was supported by Grant-in-Aid for Scientific Research on Innovative Areas (25106003). A part of this work was conducted in Research Hub for Advanced Nano Characterization, The University of Tokyo, under the support of “Nanotechnology Platform” (project No.12024046) by MEXT, Japan. This research was supported under the Discovery Projects funding scheme of the Australian Research Council (Projects No. DP110101570 and DP160102338 ).Google Scholar