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Direct Observation of Interfacial Au atoms Using STEM Depth Sectioning

Published online by Cambridge University Press:  23 September 2015

Wenpei Gao ,
Shankar Sivaramakrishnan ,
Jianguo Wen  and
Jian-Min Zuo
Wenpei Gao
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 61801
Shankar Sivaramakrishnan
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 61801
Jianguo Wen
Affiliation:
Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 61801
Jian-Min Zuo
Affiliation:
Dept of Materials Science and Engineering, University of Illinois, Urbana-Champaign, IL 61801 Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana-Champaign, IL 61801

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2417 - 2418
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Akita, T., Kohyama, M. & Haruta, M., Accounts of Chemical Research 46(8), 1773–1782 (2013).CrossRefGoogle Scholar
[2] Widmann, D., Behm, R.J. & Internatinal, Angewandte Chemie International Edition 50(43), 10241 (2011).CrossRefGoogle Scholar
[3] Zhou, Z., et al., Advanced Functional Materials 18(18), 2801–2807 (2008).CrossRefGoogle Scholar
[4] The work reported here is supported by the NSF Grant No. DMR 0449790 and AC-STEM was carried out in the Frederick Seitz Materials Research Laboratory Central Facilities. University of Illinois.Google Scholar