Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-23T05:02:39.928Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Observation of Metallic Thin Layers Dewetting By HT-ESEM

Published online by Cambridge University Press:  07 February 2019

P. Jacquet ,
B. Song ,
R. Podor ,
J. Lautru ,
E. Ruiz Trejo ,
S. J. Cooper ,
J. Teisseire ,
I. Gozhyk ,
J. Jupille  and
R. Lazzari
P. Jacquet
Affiliation:
Surface du Verre et Interfaces, UMR 125 CNRS/Saint-Gobain Recherche, 39 quai Lucien Lefranc, F-93303 Aubervilliers, France. CNRS, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France. Sorbonne Universités, UPMC Univ Paris 06, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France.
B. Song
Affiliation:
CNRS, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France.
R. Podor
Affiliation:
ICSM, CEA, CNRS, ENSCM, Univ Montpellier, Marcoule, France.
J. Lautru
Affiliation:
ICSM, CEA, CNRS, ENSCM, Univ Montpellier, Marcoule, France.
E. Ruiz Trejo
Affiliation:
Department of Earth Science and Engineering, Imperial College London, United Kingdom
S. J. Cooper
Affiliation:
Dyson School of Design Engineering, Imperial College London, London, SW7 1NA, UK.
J. Teisseire
Affiliation:
Surface du Verre et Interfaces, UMR 125 CNRS/Saint-Gobain Recherche, 39 quai Lucien Lefranc, F-93303 Aubervilliers, France.
I. Gozhyk
Affiliation:
Surface du Verre et Interfaces, UMR 125 CNRS/Saint-Gobain Recherche, 39 quai Lucien Lefranc, F-93303 Aubervilliers, France.
J. Jupille
Affiliation:
CNRS, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France. Sorbonne Universités, UPMC Univ Paris 06, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France.
R. Lazzari
Affiliation:
CNRS, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France. Sorbonne Universités, UPMC Univ Paris 06, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris, France.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Materials Science (Posters)
Information
Microscopy and Microanalysis , Volume 25 , Issue S1: Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy , February 2019 , pp. 69 - 70
Copyright
Copyright © Microscopy Society of America 2019 

References

References:

[1]Leroy, F et al. , Surf Sci Rep 71 (2016), p. 391.Google Scholar
[2]Jacquet, P et al. , Scr Mater 115 (2016), p. 128.Google Scholar
[4]Jacquet, P et al. , Acta Materialia 143 (2018), p. 281.Google Scholar