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SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions
Published online by Cambridge University Press: 23 September 2015
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1431 - 1432
- Copyright
- Copyright © Microscopy Society of America 2015
References
[3]
Iktgen, K., et al, . in" Secondary Ion Mass Spectrometry", SIMS X., ed. A. Bennighoven, B. Hagenhoff and H.W. Werner, (John Wiley & Son).Google Scholar
[4] The authors acknowledge funding from the European Commission (FP7, Grant number 200613).Google Scholar