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Effects of Evactron Plasma Cleaning on X-ray Detector Windows

Published online by Cambridge University Press:  01 August 2005

E A Kenik ,
H M Meyer ,
R Vane  and
V Carlino
E A Kenik
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
H M Meyer
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
R Vane
Affiliation:
XEI Scientic, Redwood City, California
V Carlino
Affiliation:
XEI Scientic, Redwood City, California

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1368 - 1369
Copyright
© 2005 Microscopy Society of America