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EFTEM Analysis of FIB Sections: An Important Tool in Nanotechnology

Published online by Cambridge University Press:  01 August 2005

J Mayer  and
T E Weirich
J Mayer
Affiliation:
Aachen University, Research Center Juelich, Germany
T E Weirich
Affiliation:
Aachen University, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 46 - 47
Copyright
© 2005 Microscopy Society of America