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Electron Beam as a Probe and Stimulus: Challenges and Opportunities
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
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- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Yazdi, S., Daniel, J. R, Large, N, Schatz, G. C, Boudreau, D., and Ringe, E., Nano Letters., 2016, 16, 3939-6945.CrossRefGoogle Scholar
Hough, L. E., Jung, H. T., Krüerke, D., Heberling, M. S., Nakata, M., Jones, C. D., Chen, D., Link, D. R., Zasadzinski, J., Heppke, G., Rabe, J. P., Stocker, W., Körblova, E., Walba, D. M., Glaser, M. A., Clark, N. A., Science, 2009, 325, 456-460CrossRefGoogle Scholar
The support from the Facility for Electron Microscopy of Materials at the University of Colorado at Boulder (CU FEMM) is acknowledged.Google Scholar
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