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Electron Beam Damage Mechanisms in Solution Phase Electron Microscopy of Metal-Organic Frameworks
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
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- Copyright
- Copyright © Microscopy Society of America 2022
References
This work made use of the EPIC facilities of Northwestern University's NUANCE Center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720139) at the Materials Research Center; the International Institute for Nanotechnology (IIN); and the State of Illinois, through the IIN. Research reported in this publication was supported in part by instrumentation provided by the Office of The Director, National Institutes of Health of the National Institutes of Health under Award Number S10OD026871. The content is solely the responsibility of the authors and does not necessarily represent the official views of the National Institutes of Health.Google Scholar
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