Hostname: page-component-77c89778f8-gvh9x Total loading time: 0 Render date: 2024-07-19T05:50:55.908Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Beam Induced Domain Motion in Ferroelectric RKTP Observed By Transmission Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

James L. Hart ,
Miryam Arredondo  and
Mitra L. Taheri
James L. Hart
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia PA, US
Miryam Arredondo
Affiliation:
School of Mathematics and Physics, Queens University, Belfast Northern Ireland, UK
Mitra L. Taheri
Affiliation:
Department of Materials Science and Engineering, Drexel University, Philadelphia PA, US

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 271 - 272
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Winkler, C. R., et al., Micron 43 (2012) 1121–2226.Google Scholar
[2] Winkler, C. R., et al., J. Appl. Phys 112 (2012.Google Scholar
[3] Winkler, C. R., et al., Nano Letters 14 (2014) 3617–3622.Google Scholar
[4] Cazaux, J., Ultramicroscopy 60 (1995) 411–425.Google Scholar