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Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections
Published online by Cambridge University Press: 25 July 2016
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 926 - 927
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- © Microscopy Society of America 2016
References
References:
[1]
Schatten, H, Jan, JW & Litwin, A Scanning Electron Microscopy for the Life Sciences (2013).CrossRefGoogle Scholar
[2]
Yakushevska, AE, et al.,
Journal of Structural Biology
159
(2007). p. 381–391.CrossRefGoogle Scholar
[3]
Robinson, DG in
“Methods of Preparation for Electron Microscopy”. Springer-Verlag, Berlin
(1987).CrossRefGoogle Scholar
[10]
Volkenandt, T, Muller, E. & Gerthsen, D.
Microscopy and Microanalysis
20
(2014). p. 111–123.CrossRefGoogle Scholar
[11]
Krzyzanek, V & Reichelt, R.
Microscopy and Microanalysis
9
(2003). p. 110–111.CrossRefGoogle Scholar
[12]
Krzyzanek, V, et al.,
Journal of Structural Biology
165
(2009). p. 78–87.CrossRefGoogle Scholar
[13] The research was supported by the Grant Agency of the Czech Republic (GA14-20012S), Ministry of Education, Youth and Sports of the Czech Republic (LO1212). The research infrastructure was funded by Ministry of Education, Youth and Sports of the Czech Republic and European Commission (CZ.1.05/2.1.00/01.0017).Google Scholar
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