Hostname: page-component-5c6d5d7d68-tdptf Total loading time: 0 Render date: 2024-08-06T11:21:32.695Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Channeling Artifacts in Silicon [211] Using Aberration-Corrected STEM

Published online by Cambridge University Press:  26 July 2009

R Hovden ,
HL Xin  and
DA Muller
R Hovden
Affiliation:
Cornell University
HL Xin
Affiliation:
Cornell University
DA Muller
Affiliation:
Cornell University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1492 - 1493
Copyright
Copyright © Microscopy Society of America 2009