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Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
Published online by Cambridge University Press: 27 August 2014
Abstract
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- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1024 - 1025
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- Copyright © Microscopy Society of America 2014
References
[7] This work was carried out with the partial support of the EU under the ITN RAINBOW (http://rainbow.ensicaen.fr/), grant agreement No: PITN-GA-2008-213238 and EPSRC grant No: EP/D058686/1.Google Scholar