Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Merlet, C.
and
Llovet, X.
2011.
New measurements of the surface ionization for quantitative electron probe microanalysis.
X-Ray Spectrometry,
Vol. 40,
Issue. 1,
p.
47.
Cazaux, J
2011.
Angle-resolved electron probe microanalysis revisited.
Journal of Physics D: Applied Physics,
Vol. 44,
Issue. 35,
p.
355502.
Popova, T. B.
Bakaleinikov, L. A.
Flegontova, E. Yu.
Shakhmin, A. A.
and
Zamoryanskaya, M. V.
2011.
Electron probe microanalysis of heterostructures with nanolayers.
Semiconductors,
Vol. 45,
Issue. 2,
p.
260.
Merlet, C
and
Llovet, X
2012.
Uncertainty and capability of quantitative EPMA at low voltage – A review.
IOP Conference Series: Materials Science and Engineering,
Vol. 32,
Issue. ,
p.
012016.
Gauvin, Raynald
2012.
What Remains to Be Done to Allow Quantitative X-Ray Microanalysis Performed with EDS to Become a True Characterization Technique?.
Microscopy and Microanalysis,
Vol. 18,
Issue. 5,
p.
915.
Shakhmin, Alexey A.
Sedova, Irina V.
Sorokin, Sergey V.
and
Zamoryanskaya, Maria V.
2013.
Depth resolved cathodoluminescence and microanalysis of ZnCdSe/ZnSe quantum well heterostructures.
Superlattices and Microstructures,
Vol. 56,
Issue. ,
p.
27.
Moy, A
Merlet, C
Llovet, X
and
Dugne, O
2013.
Measurements of absolute L- and M-subshell x-ray production cross sections of Pb by electron impact.
Journal of Physics B: Atomic, Molecular and Optical Physics,
Vol. 46,
Issue. 11,
p.
115202.
Moy, A.
Merlet, C.
Llovet, X.
and
Dugne, O.
2013.
Optimization of actinide quantification by electron probe microanalysis.
p.
1.
Moy, A.
Merlet, C.
Llovet, X.
and
Dugne, O.
2014.
Optimization of Actinide Quantification by Electron Probe Microanalysis.
IEEE Transactions on Nuclear Science,
Vol. 61,
Issue. 4,
p.
1977.
Moy, A.
Merlet, C.
and
Dugne, O.
2014.
Measurements of absolute M-subshell X-ray production cross sections of Th by electron impact.
Chemical Physics,
Vol. 440,
Issue. ,
p.
18.
Moy, A
Merlet, C
Llovet, X
and
Dugne, O
2014.
M-subshell ionization cross sections of U by electron impact.
Journal of Physics B: Atomic, Molecular and Optical Physics,
Vol. 47,
Issue. 5,
p.
055202.
Merlet, Claude
Moy, Aurélien
Llovet, Xavier
and
Dugne, Olivier
2014.
Measurements of absolute Mα x‐ray production cross sections of heavy elements Au, Pb, Bi, and U by electron impact.
Surface and Interface Analysis,
Vol. 46,
Issue. 12-13,
p.
1170.
Moy, Aurélien
Merlet, Claude
and
Dugne, Olivier
2015.
Standardless Quantification of Heavy Elements by Electron Probe Microanalysis.
Analytical Chemistry,
Vol. 87,
Issue. 15,
p.
7779.
Merlet, Claude
2015.
Quantification of Nano-inclusions by EPMA Using Conventional Accelerating Voltages.
Microscopy and Microanalysis,
Vol. 21,
Issue. S3,
p.
1439.
Rinaldi, Romano
and
Llovet, Xavier
2015.
Electron Probe Microanalysis: A Review of the Past, Present, and Future.
Microscopy and Microanalysis,
Vol. 21,
Issue. 5,
p.
1053.
Llovet, X
and
Salvat, F
2016.
PENEPMA: a Monte Carlo programme for the simulation of X-ray emission in EPMA.
IOP Conference Series: Materials Science and Engineering,
Vol. 109,
Issue. ,
p.
012009.
Llovet, Xavier
and
Salvat, Francesc
2017.
PENEPMA: A Monte Carlo Program for the Simulation of X-Ray Emission in Electron Probe Microanalysis.
Microscopy and Microanalysis,
Vol. 23,
Issue. 3,
p.
634.
Darznek, S. A.
Mityukhlyaev, V. B.
Todua, P. A.
and
Filippov, M. N.
2018.
Electron Probe X-Ray Analysis of Nanofilms at Off-Normal Incidence of the Electron Beam.
Inorganic Materials,
Vol. 54,
Issue. 14,
p.
1417.
Romaguera-Barcelay, Y.
Figueiras, F.G.
Moreira, J. Agostinho
Pérez-de-la-Cruz, J.
Tavares, P.B.
and
Almeida, A.
2018.
Handling magnetic and structural properties of EuMnO3 thin films by the combined effect of Lu doping and substrate strain.
Journal of Alloys and Compounds,
Vol. 762,
Issue. ,
p.
319.
Llovet, Xavier
2018.
Reference Module in Chemistry, Molecular Sciences and Chemical Engineering.