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Electron Tomography of Si and Er Particles in SiOx film Without Missing Wedge

Published online by Cambridge University Press:  01 August 2010

P Li ,
P Concepcion ,
X Wang ,
M Malac  and
A Meldrum
P Li
Affiliation:
National Institute for Nanotechnology, Canada
P Concepcion
Affiliation:
National Institute for Nanotechnology, Canada
X Wang
Affiliation:
National Institute for Nanotechnology, Canada
M Malac
Affiliation:
National Institute for Nanotechnology, Canada
A Meldrum
Affiliation:
National Institute for Nanotechnology, Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1886 - 1887
Copyright
Copyright © Microscopy Society of America 2010