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Electron/Ion Microscopy of Low-temperature Sintered Y-TZP Ceramics with Additive of Lithium Disilicate Glass for Dental Restorations

Published online by Cambridge University Press:  22 July 2022

Jiancun Rao ,
Ke Li ,
Congqin Ning  and
Wen-An Chiou
Jiancun Rao
Affiliation:
Advanced Imaging and Microscopy Laboratory (AIM Lab), Maryland NanoCenter, University of Maryland, College Park, MD, United States
Ke Li
Affiliation:
State Key Laboratory of High-Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, China
Congqin Ning*
Affiliation:
The Education Ministry Key Lab of Resource Chemistry and Shanghai Key Laboratory of Rare Earth Functional Materials, Shanghai Normal University, China
Wen-An Chiou
Affiliation:
Advanced Imaging and Microscopy Laboratory (AIM Lab), Maryland NanoCenter, University of Maryland, College Park, MD, United States
*
*Corresponding author: cqning@shnu.edu.cn

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 44 - 45
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Copyright
Copyright © Microscopy Society of America 2022

References

Guazzato, M et al. , Dent Mater 20 (2004), p. 449.CrossRefGoogle Scholar
Gautam, C et al. , Dalton T 45 (2016), p. 19194.CrossRefGoogle Scholar
Hoppe, A et al. , Biomaterials 32 (2011), p. 2757.CrossRefGoogle Scholar
Li, K et al. , J Adv Ceramic 10 (6) (2021), p. 1326.CrossRefGoogle Scholar
Miranda, RBD et al. , Int J Appl Ceram Tec. 16 (2019), p. 1979.CrossRefGoogle Scholar
EM (TEM and ToF-SIMS) research was partially supported by the AIM Lab, Maryland NanoCenter at University of Maryland.Google Scholar