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Elemental Quantification and Experimental Measurement of Mean Free Path Using EELS and CBED at 30 keV
Published online by Cambridge University Press: 22 July 2022
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- Type
- Memorial Symposium: John C.H. Spence
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- Copyright
- Copyright © Microscopy Society of America 2022
References
Williams, DB and Carter, CB in "Inelastic Scattering and Beam Damage, Transmission Electron Microscopy: A Textbook for Materials Science", (Springer US, Boston, MA), p. 53.Google Scholar
Kotakoski, J et al. , Physical Review B 82(11) (2010), p. 113404.10.1103/PhysRevB.82.113404CrossRefGoogle Scholar
Egerton, RF in "Electron energy-loss spectroscopy in the electron microscope", (Springer, New York).Google Scholar
Holt, JB and Munir, ZA, Journal of Materials Science 21(1) (1986 ), p. 251.10.1007/BF01144729CrossRefGoogle Scholar
Malis, T, Cheng, SC and Egerton, RF, Journal of Electron Microscopy Technique 8(2) (1988), p. 193.10.1002/jemt.1060080206CrossRefGoogle Scholar