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Epoxy Resin Removal Technique in Cross-section Cuts for SEM
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Richard, Wirth, Focused Ion Beam (FIB) combined with SEM and TEM: Advanced Analytical Tools for Studies of Chemical Composition, Microstructure and Crystal structure in Geomaterials on a Nanometre scale. Chemical Geology, Elsevier. 2019, (261) 217–229.10.1016/j.chemgeo.2008.05.019CrossRefGoogle Scholar