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Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries
Published online by Cambridge University Press: 23 September 2015
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- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1411 - 1412
- Copyright
- Copyright © Microscopy Society of America 2015
References
Reference:
[2]
Genc, A., Williams, R.E.A., Huber, D. & Fraser, H.L., Microsc Microanal
13
Suppl 2 (2007).Google Scholar
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