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Exploration of Doped Semiconductors at the Atomic Scale

Published online by Cambridge University Press:  04 August 2017

Alfonso Rodil ,
Christian Krammel ,
Rianne Plantenga ,
Sebastian Kôlling  and
Paul Koenraad
Alfonso Rodil
Affiliation:
Department of Applied Physics & Institute for Photonic Integration, Eindhoven University of Technology, Eindhoven, the Netherlands.
Christian Krammel
Affiliation:
Department of Applied Physics & Institute for Photonic Integration, Eindhoven University of Technology, Eindhoven, the Netherlands.
Rianne Plantenga
Affiliation:
Department of Applied Physics & Institute for Photonic Integration, Eindhoven University of Technology, Eindhoven, the Netherlands.
Sebastian Kôlling
Affiliation:
Department of Applied Physics & Institute for Photonic Integration, Eindhoven University of Technology, Eindhoven, the Netherlands.
Paul Koenraad
Affiliation:
Department of Applied Physics & Institute for Photonic Integration, Eindhoven University of Technology, Eindhoven, the Netherlands.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 670 - 671
Copyright
© Microscopy Society of America 2017 

References

[1] Koenraad, P. M. & Flatté, M.E. Nature Materials 10 2011 96.Google Scholar
[2] Koelling, S., et al“Atom-by-Atom Analysis of Semiconductor Nanowires with Parts Per Million Sensitivity” Nano Letters DOI: 10.1021/acs.nanolett.6b03109.Google Scholar