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Exploration of Single-Atom X-ray Analysis in an Analytical Electron Microscope

Published online by Cambridge University Press:  25 July 2016

M. Watanabe
M. Watanabe*
Affiliation:
Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA 18015

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 850 - 851
Copyright
© Microscopy Society of America 2016 

References

[1] Pennycook, S.J. & Nellist, P.D. ed. Scanning Transmission Electron Microscopy: Imaging and Analysis. Springer, NY (2011).CrossRefGoogle Scholar
[2] Lovejoy, T., et al., Appl. Phys. Lett 100 (2012) 154101 (4 pages).Google Scholar
[3] Fiori, C.E., et al., Public domain DTSA software package (1992).Google Scholar
[4] Williams, D.B. & Carter., C.B. Transmission Electron Microscopy. Springer, NY (2009).Google Scholar
[5] Watanabe, M. & Williams, D.B. Ultramicrosc 78 (1999) 89.Google Scholar
[6] The author wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229.Google Scholar