Hostname: page-component-77c89778f8-vpsfw Total loading time: 0 Render date: 2024-07-18T08:29:57.083Z Has data issue: false hasContentIssue false
  • English
  • Français

Fast Solid State Electron Detectors Based on the Principle of Silicon Drift Detectors for Efficient Soft and Hard Matter Analysis – ERRATUM

Published online by Cambridge University Press:  29 May 2018

A. Liebel ,
G. Lutz ,
U. Weber ,
A. Niculae  and
H. Soltau

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Correction
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2447
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Schropp, A, et al., (2015) High-Resolution Phase-Contrast Imaging at XFELs. Microsc Microanal 21, Suppl 3 doi:10.1017/S1431927615011617.Google Scholar
[2] Liebel, A, et al., (2014) Fast Solid State Electron Detectors Based on the Principle of Silicon Drift Detectors for Efficient Soft and Hard Matter Analysis. Microsc Microanal 21, Suppl 3 doi:10.1017/S143192761501507X.Google Scholar