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Finding Optimal Imaging Parameters for Measuring Long-Range Electric Fields with 4DSTEM by Utilizing STEM Multislice Simulations

Published online by Cambridge University Press:  22 July 2022

Damien Heimes ,
Andreas Beyer ,
Shamail Ahmed ,
Varun Chejarla  and
Kerstin Volz
Damien Heimes*
Affiliation:
Department of Physics and Materials Science Center, Philipps-University Marburg, Marburg, Germany
Andreas Beyer
Affiliation:
Department of Physics and Materials Science Center, Philipps-University Marburg, Marburg, Germany
Shamail Ahmed
Affiliation:
Department of Physics and Materials Science Center, Philipps-University Marburg, Marburg, Germany
Varun Chejarla
Affiliation:
Department of Physics and Materials Science Center, Philipps-University Marburg, Marburg, Germany
Kerstin Volz
Affiliation:
Department of Physics and Materials Science Center, Philipps-University Marburg, Marburg, Germany
*
*Corresponding author: damien.heimes@physik.uni-marburg.de

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 440 - 441
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Copyright
Copyright © Microscopy Society of America 2022

References

Beyer, A., et al. , Nano letters 21.5 (2021): 2018-2025.CrossRefGoogle Scholar
Gao, W., et al. , Nature 575.7783 (2019): 480-484.CrossRefGoogle Scholar
Müller, K., et al. , Nature communications 5.1 (2014): 1-8.Google Scholar
Oelerich, J. O., et al. , Ultramicroscopy 177 (2017): 91-96.CrossRefGoogle Scholar
Kirkland, E. J., Advanced computing in electron microscopy. Springer Science & Business Media, 2010.CrossRefGoogle Scholar
Neudeck, G. W., The PN junction diode. No. 2. Addison Wesley Publishing Company, 1983.Google Scholar