Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Yoon, Kevin E.
Sudbrack, Chantal K.
Noebe, Ronald D.
and
Seidman, David N.
2005.
The temporal evolution of the nanostructures of model Ni–Al–Cr and Ni–Al–Cr–Re superalloys.
Zeitschrift für Metallkunde,
Vol. 96,
Issue. 5,
p.
481.
Fukuzawa, H.
Iwasaki, H.
Tanaka, Y.
Ulfig, R.M.
and
Larson, D.J.
2005.
DIrect observation of a current-confined-path nano-oxide layer structure by three-dimensional atom probe.
p.
1699.
Thompson, Keith
Booske, John H.
Larson, David J.
and
Kelly, Thomas F.
2005.
Three-dimensional atom mapping of dopants in Si nanostructures.
Applied Physics Letters,
Vol. 87,
Issue. 5,
Wetzel, A.
Socoliuc, A.
Meyer, E.
Bennewitz, R.
Gnecco, E.
and
Gerber, C.
2005.
A versatile instrument for in situ combination of scanning probe microscopy and time-of-flight mass spectrometry.
Review of Scientific Instruments,
Vol. 76,
Issue. 10,
Miller, M.K.
Russell, K.F.
and
Thompson, G.B.
2005.
Strategies for fabricating atom probe specimens with a dual beam FIB.
Ultramicroscopy,
Vol. 102,
Issue. 4,
p.
287.
Burke, M. G.
Watanabe, M.
Williams, D. B.
and
Hyde, J. M.
2006.
Quantitative characterization of nanoprecipitates in irradiated low-alloy steels: advances in the application of FEG-STEM quantitative microanalysis to real materials.
Journal of Materials Science,
Vol. 41,
Issue. 14,
p.
4512.
Perea, D.E.
Lensch, J.L.
May, S.J.
Wessels, B.W.
and
Lauhon, L.J.
2006.
Composition analysis of single semiconductor nanowires using pulsed-laser atom probe tomography.
Applied Physics A,
Vol. 85,
Issue. 3,
p.
271.
Kotula, Paul G.
Keenan, Michael R.
and
Michael, Joseph R.
2006.
Tomographic Spectral Imaging with Multivariate Statistical Analysis: Comprehensive 3D Microanalysis.
Microscopy and Microanalysis,
Vol. 12,
Issue. 01,
p.
36.
Honma, Tomoyuki
Saxey, David W.
and
Ringer, Simon P.
2006.
Effect of Trace Addition of Sn in Al-Cu Alloy.
Materials Science Forum,
Vol. 519-521,
Issue. ,
p.
203.
Perea, Daniel E.
Allen, Jonathan E.
May, Steven J.
Wessels, Bruce W.
Seidman, David N.
and
Lauhon, Lincoln J.
2006.
Three-Dimensional Nanoscale Composition Mapping of Semiconductor Nanowires.
Nano Letters,
Vol. 6,
Issue. 2,
p.
181.
van Dalen, Marsha E.
Dunand, David C.
and
Seidman, David N.
2006.
Nanoscale precipitation and mechanical properties of Al-0.06 at.% Sc alloys microalloyed with Yb or Gd.
Journal of Materials Science,
Vol. 41,
Issue. 23,
p.
7814.
Sebastian, J.T.
Seidman, D.N.
Yoon, K.E.
Bauer, P.
Reid, T.
Boffo, C.
and
Norem, J.
2006.
Atom-probe tomography analyses of niobium superconducting RF cavity materials.
Physica C: Superconductivity,
Vol. 441,
Issue. 1-2,
p.
70.
Larson, D.J.
2006.
Atom probe characterization of nanomagnetic materials.
Thin Solid Films,
Vol. 505,
Issue. 1-2,
p.
16.
Kelly, Thomas F
Thompson, Keith
Marquis, Emmanuelle A
and
Larson, David J
2006.
Atom Probe Tomography Defines Mainstream Microscopy at the Atomic Scale.
Microscopy Today,
Vol. 14,
Issue. 4,
p.
34.
Thompson, Keith
Bunton, J. H.
Kelly, Thomas F.
and
Larson, David J.
2006.
Characterization of ultralow-energy implants and towards the analysis of three-dimensional dopant distributions using three-dimensional atom-probe tomography.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Vol. 24,
Issue. 1,
p.
421.
Gorman, Brian P.
Norman, Andrew G.
and
Yan, Yanfa
2007.
Atom Probe Analysis of III–V and Si-Based Semiconductor Photovoltaic Structures.
Microscopy and Microanalysis,
Vol. 13,
Issue. 6,
p.
493.
Kolli, R. Prakash
and
Seidman, David N.
2007.
Comparison of Compositional and Morphological Atom-Probe Tomography Analyses for a Multicomponent Fe-Cu Steel.
Microscopy and Microanalysis,
Vol. 13,
Issue. 4,
p.
272.
Cerezo, Alfred
Clifton, Peter H.
Galtrey, Mark J.
Humphreys, Colin J.
Kelly, Thomas F.
Larson, David J.
Lozano-Perez, Sergio
Marquis, Emmanuelle A.
Oliver, Rachel A.
Sha, Gang
Thompson, Keith
Zandbergen, Mathijs
and
Alvis, Roger L.
2007.
Atom probe tomography today.
Materials Today,
Vol. 10,
Issue. 12,
p.
36.
Knipling, Keith E.
Dunand, David C.
and
Seidman, David N.
2007.
Atom Probe Tomographic Studies of Precipitation in Al-0.1Zr-0.1Ti (at.%) Alloys.
Microscopy and Microanalysis,
Vol. 13,
Issue. 6,
p.
503.
Miller, M.K.
and
Russell, K.F.
2007.
Atom probe specimen preparation with a dual beam SEM/FIB miller.
Ultramicroscopy,
Vol. 107,
Issue. 9,
p.
761.