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Focused Ion Beam as a Direct-write Mask Tool for Patterning Diamond

Published online by Cambridge University Press:  26 July 2009

W McKenzie ,
J Pethica  and
G Cross
W McKenzie
Affiliation:
Trinity College,Ireland
J Pethica
Affiliation:
Trinity College,Ireland
G Cross
Affiliation:
Trinity College,Ireland

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 328 - 329
Copyright
Copyright © Microscopy Society of America 2009