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Focused Ion Beam Enabled Analysis of Nanocomposite and Nanostructured Soft Materials

Published online by Cambridge University Press:  31 July 2006

SE Kooi ,
J-H Jang ,
C Ullal  and
EL Thomas
SE Kooi
Affiliation:
Massachusetts Institute of Technology
J-H Jang
Affiliation:
Massachusetts Institute of Technology
C Ullal
Affiliation:
Massachusetts Institute of Technology
EL Thomas
Affiliation:
Massachusetts Institute of Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1264 - 1265
Copyright
© 2006 Microscopy Society of America