Focused Ion Beam Induced X-Ray Analysis

L A Giannuzzi

doi:10.1017/S1431927605508420

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Focused Ion Beam Induced X-Ray Analysis

Published online by Cambridge University Press: 01 August 2005

L A Giannuzzi

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L A Giannuzzi: Affiliation:
FEI Company, Hillsboro, Oregon

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type: Research Article
Information: Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1348 - 1349

DOI: https://doi.org/10.1017/S1431927605508420 [Opens in a new window]
Copyright: © 2005 Microscopy Society of America

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Focused Ion Beam Induced X-Ray Analysis

Volume 11, Issue S02
L A Giannuzzi ^(a1)
DOI: https://doi.org/10.1017/S1431927605508420

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Focused Ion Beam Induced X-Ray Analysis

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