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A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips

Published online by Cambridge University Press:  27 August 2014

R. Prakash Kolli  and
Frederick Meisenkothen
R. Prakash Kolli
Affiliation:
Department of Materials Science and Engineering, University of Maryland, College Park, MD, USA Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD, USA
Frederick Meisenkothen
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 350 - 351
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Larson, D. J., et al. Ultramicrosc. 79 (1999) 287.Google Scholar
[2] Larson, D. J., et al. Microsc. Microanal. 7 (2001) 24.Google Scholar
[3] Thompson, G. B., et al. Ultramicrosc. 100 (2004) 25.Google Scholar
[4] Thompson, K., et al. Ultramicrosc. 107 (2007) 131.Google Scholar
[5] Miller, M. K., et al. Ultramicrosc. 102 (2005) 287.Google Scholar
[6] Miller, M. K.and Russell, K. F. Ultramicrosc. 107, 761 (2007.Google Scholar
[7] Giannuzzi, L. A., et al. in Introduction to Focused Ion Beams, edited by L. A. Giannuzzi and F. A. Stevie (Springer US (2005), pp. 201–228.Google Scholar
[8] Certain commercial equipment, instruments, or materials are identified in this paper in order to specify the experimental procedure adequately. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials or equipment identified are necessarily the best available for the purpose.Google Scholar